Memory device

ABSTRACT

A device is disclosed that includes a driver, a sinker and a memory column. The memory column includes a plurality of resistive memory cells each being electrically connected between the driver and the sinker through a first line and a second line. When one of the resistive memory cells is conducted, at least one of the driver and the sinker is configured to be controlled to have a resistance depending on a row location of the conducted resistive memory cell in the memory column.

RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No.15/065,787, filed Mar. 9, 2016, which is herein incorporated byreference.

BACKGROUND

Resistive memory device has been widely used due to the properties,including, for example, high stability, high reliability, simplestructure, and compatibility with complementarymetal-oxide-semiconductor (CMOS) process. The resistive memory device isa memory device which can store data by applying voltages with differentpolarities and levels to change resistance of resistive material.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 is a circuit diagram of a memory device in accordance withvarious embodiments of the present disclosure;

FIG. 2A is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 2B is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 3A is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 3B is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 4A is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 4B is a simplified circuit diagram of a portion of the memorydevice in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 5A and FIG. 5B are exemplary variations of the configuration of thesinker in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 5C and FIG. 5D are exemplary variations of the configuration of thedriver in FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 6 is a flow chart of a method illustrating the operation of thememory device in FIG. 1, in accordance with various embodiments of thepresent disclosure;

FIG. 7 is a circuit diagram of a memory device in accordance withalternative embodiments of the present disclosure;

FIG. 8 is a circuit diagram of a simplified portion of the memory devicein FIG. 1, in accordance with various embodiments of the presentdisclosure;

FIG. 9 is a circuit diagram of a resistor driving unit for driving thereference resistor in FIG. 8, in accordance with various embodiments ofthe present disclosure; and

FIG. 10 is a current to voltage curve of the operation of the drivingmetal oxide semiconductor resistor in FIG. 9, in accordance with variousembodiments of the present disclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

The terms used in this specification generally have their ordinarymeanings in the art and in the specific context where each term is used.The use of examples in this specification, including examples of anyterms discussed herein, is illustrative only, and in no way limits thescope and meaning of the disclosure or of any exemplified term.Likewise, the present disclosure is not limited to various embodimentsgiven in this specification.

It will be understood that, although the terms “first,” “second,” etc.,may be used herein to describe various elements, these elements shouldnot be limited by these terms. These terms are used to distinguish oneelement from another. For example, a first element could be termed asecond element, and, similarly, a second element could be termed a firstelement, without departing from the scope of the embodiments. As usedherein, the term “and/or” includes any and all combinations of one ormore of the associated listed items.

As used herein, the terms “comprising,” “including,” “having,”“containing,” “involving,” and the like are to be understood to beopen-ended, i.e., to mean including but not limited to.

Reference throughout the specification to “one embodiment” or “anembodiment” means that a particular feature, structure, implementation,or characteristic described in connection with the embodiment isincluded in at least one embodiment of the present disclosure. Thus,uses of the phrases “in one embodiment” or “in an embodiment” in variousplaces throughout the specification are not necessarily all referring tothe same embodiment. Furthermore, the particular features, structures,implementation, or characteristics may be combined in any suitablemanner in one or more embodiments.

Reference is now made to FIG. 1. FIG. 1 is a circuit diagram of a memorydevice 100 in accordance with various embodiments of the presentdisclosure.

For illustration, the memory device 100 includes a memory array 110arranged in rows and columns. The memory array 110 includes a pluralityof resistive memory cells 115 each disposed at an intersection of one ofthe memory rows and one of the memory columns. For simplicity, only oneresistive memory cell 115 is labeled in FIG. 1. The like resistivememory cells in FIG. 1 are also each referred to as the resistive memorycell 115.

In some embodiments, each of the resistive memory cells 115 is amagnetoresistive random-access memory (MRAM), and in some otherembodiments, each of the resistive memory cells 115 is a resistiverandom-access memory (RRAM). In some embodiments, each of the resistivememory cells 115 is an architecture of one transistor and one resistor(1T1R). Illustratively, each of the resistive memory cells 115 isexemplarily illustrated as a transistor MT and a resistor MRelectrically connected in series in FIG. 1.

Each of the resistive memory cells 115 has a high resistance state and alow resistance state that are interchangeable based on a write operationperformed thereon. For illustration, the resistance of each of theresistive memory cells 115 under the high resistance state, which isalso referred to as “high state resistance,” is higher than itsresistance under the low resistance state, which is also referred to as“low state resistance.” In operation, the resistance state of theresistive memory cells 115 is modified by a write current appliedthereon.

The type and configuration of the resistive memory cells 115 illustratedin FIG. 1 are given for illustrative purposes. Various types andconfigurations of the resistive memory cells 115 are within thecontemplated scope of the present disclosure.

In some embodiments, the memory device 100 further includes a driver120, a driver 125, a sinker 130 and a sinker 135. For illustration, eachof the resistive memory cells 115 in one of the memory columns iselectrically connected to the driver 120 through, for illustration, oneof the source lines SL[0], . . . and SL[n]. Furthermore, each of theresistive memory cells 115 in one of the memory columns is electricallyconnected to the sinker 135 through, for illustration, one of the bitlines BL[0], . . . and BL[n].

In some embodiments, each of the resistive memory cells 115 in one ofthe memory columns is also electrically connected to the driver 125through, for illustration, one of the bit lines BL[0], . . . and BL[n].Furthermore, each of the resistive memory cells 115 in one of the memorycolumns is also electrically connected to the sinker 130 through, forillustration, one of the source lines SL[0], . . . and SL[n].

For illustration of the resistive memory cell 115 labeled in FIG. 1, theresistive memory cell 115 is electrically connected to the driver 120and the sinker 135 through the source line SL[0] and the bit line BL[0],respectively. Furthermore, the resistive memory cell 115 labeled in FIG.1 is also electrically connected to the driver 125 and the sinker 130through the bit line BL[0] and the source line SL[0], respectively. Theresistive memory cell 115 labeled in FIG. 1 is given for illustration.The like resistive memory cells in FIG. 1 are configured like theresistive memory cell 115 labeled in FIG. 1, and they are not furtherdetailed for simplicity of illustration.

In some embodiments, the memory device 100 further includes groups ofswitches, and each group corresponds to one column of resistive memorycells 115. For illustration in FIG. 1, the group of switches P1, P2, N1and N2 corresponds to the memory column electrically connected to thebit line BL[0] and the source line SL[0]. The group of switches P3, P4,N3 and N4 corresponds to the memory column electrically connected to thebit line BL[n] and the source line SL[n]. Each group of switchesmentioned above is configured for selecting the corresponding column toperform write operation.

For illustration in FIG. 1, the switch P1 is electrically connectedbetween the driver 125 and the bit line BL[0]. The switch P2 iselectrically connected between the driver 120 and the source line SL[0].Both of the switch P1 and the switch P2 are under the control of aselection signal WR[0].

The switch N1 is electrically connected between the sinker 135 and thebit line BL[0]. The switch N2 is electrically connected between thesinker 130 and the source line SL[0]. Both of the switch N1 and theswitch N2 are under the control of a selection signal MUX[0].

In some embodiments, the switches P1 and P2 are P-type transistors andthe switches N1 and N2 are N-type transistors. In operation, when theselection signal WR[0] is at a low state and the selection signalsMUX[0] is at a high state, the switches P1, P2, N1 and N2 are conducted.Accordingly, the column of the resistive memory cells 115 correspondingto the bit line BL[0] and the source line SL[0] is selected to performthe write operation.

For another illustration, the switch P3 is electrically connectedbetween the driver 125 and the bit line BL[n]. The switch P4 iselectrically connected between the driver 120 and the source line SL[n].Both of the switch P3 and the switch P4 are under the control of aselection signal WR[n].

The switch N3 is electrically connected between the sinker 135 and thebit line BL[n]. The switch N4 is electrically connected between thesinker 130 and the source line SL[n]. Both of the switch N3 and theswitch N4 are under the control of a selection signal MUX[n].

In some embodiments, the switches P3 and P4 are P-type transistors andthe switches N3 and N4 are N-type transistors. In operation, when theselection signal WR[n] is at a low state and the selection signalsMUX[n] is at a high state, the switches P3, P4, N3 and N4 are conductedsuch that the column of the resistive memory cells 115 corresponding tothe bit line BL[n] and the source line SL[n] is selected to perform thewrite operation.

The detail circuits of the switches P1-P4 and N1-N4 illustrated in FIG.1 are given for illustrative purposes. Various circuits for performingcolumn selection are within the contemplated scope of the presentdisclosure. Furthermore, the switches discussed in the presentdisclosure are given for illustrative purposes. Various types ofswitches are within the contemplated scope of the present disclosure.

For illustration, each of the resistive memory cells 115 in one of thememory rows is electrically connected to a word line, e.g., one of theword lines WL[0], . . . WL[m−1] and WL[m]. In operation, one of theresistive memory cells 115 in a selected memory column is controlled tobe conducted according to a control signal from the corresponding wordline to perform the write operation. For illustration, the resistivememory cell 115 in the first memory row in a selected memory columns iscontrolled to be conducted according to the control signal from the wordline WL[0].

In some embodiments, the selection signals WR[0] to WR[n] and MUX[0] toMUX[n] and the control signal transmitted through the word linesWL[0]-WL[m] are generated based on at least address decode information(not labeled). The address decode information reflects the row locationof the conducted resistive memory cell 115 in the memory column.

As a result, based on the selection signals and the control signal, oneof the resistive memory cells 115 in one of the memory columns isselected to perform write operation. For illustration, when the switchesP1, P2, N1 and N2 are conducted according to the selection signal WR[0]and the selection signals MUX[0] and the control signal is transmittedthrough the word line WL[0], the write operation is performed on theresistive memory cell 115 disposed in the first memory column and thefirst memory row.

In order to perform the write operation, one of the drivers 120 and 125is activated by the signals SLD or BLD to provide a write current.Furthermore, the sinkers 130 and 135 that are complimentary to thedrivers 120 and 125, respectively, are activated by the signals SLS andBLS, respectively.

For illustration, the driver 120 is controlled to be conducted by thesignal SLD to provide a write current Iw1 flowing through one of thesource lines corresponding to the selected memory column, e.g., thesource line SL[0] to the conducted resistive memory cell 115. The sinker135 is controlled to be conducted by the signal BLS to sink the writecurrent Iw1 from the conducted resistive memory cell 115 flowing throughone of the bit lines corresponding to the selected memory column, e.g.,the bit line BL[0]. Under such a condition, the driver 125 and thesinker 130 are disabled by the signals BLD and SLS, respectively.

For another illustration, the driver 125 is controlled to be conductedby the signal BLD to provide the write current Iw2 flowing through oneof the bit lines corresponding to the selected memory column, e.g., thebit line BL[0], to the conducted resistive memory cell 115. The sinker130 is controlled to be conducted by the signal SLS to sink the writecurrent Iw2 from the conducted resistive memory cell 115 flowing throughone of the source lines corresponding to the selected memory column,e.g., the source line SL[0]. Under such a condition, the driver 120 andthe sinker 135 are disabled by the signals SLD and BLS respectively.

In some embodiment, when the driver 120 and the sinker 135 are used toperform write operation, one of the driver 120 and the sinker 135 has atrimmable resistance. The trimmable resistance is trimmed based on therow location of the conducted resistive memory cell 115 in the memorycolumn.

Reference is now made to FIG. 2A and FIG. 2B. FIG. 2A is a simplifiedcircuit diagram of the driver 120, the conducted resistive memory cell115 corresponding to the word line WL[0], the sinker 135, the sourceline SL[0] and bit line BL[0], as illustrated in FIG. 1, in accordancewith various embodiments of the present disclosure. FIG. 2B is asimplified circuit diagram of the driver 120, the conducted resistivememory cell 115 corresponding to the word line WL[m], the sinker 135,the source line SL[0] and bit line BL[0], as illustrated in FIG. 1, inaccordance with various embodiments of the present disclosure.

Illustratively, the driver 120 includes a P-type transistor PDelectrically connected to a voltage source VCH. The driver 120 iscontrolled to be conducted by the signal SLD to provide the writecurrent Iw1.

The sinker 135 includes three parallel-connected resistive unitselectrically connected to a ground potential GND. For illustration, theresistive units are N-type transistors NS1, NS2 and NS3.

According to different row locations of the conducted resistive memorycell 115, different number of the N-type transistors NS1, NS2 and NS3 iscontrolled to be conducted by the signal BLS to sink the write currentIw1. In some embodiments, the signal BLS includes a multiple of bits tocontrol the operation of the N-type transistors NS1, NS2 and NS3respectively.

Illustratively in FIG. 2A, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[0] is closer to thedriver 120. Under such a condition, the resistance contributed by thesource line SL[0] is smaller than the resistance contributed by the bitline BL[0] along the current flowing path.

As a result, more of the N-type transistors, including, for example, allof the three N-type transistors NS1, NS2 and NS3, are controlled to beconducted. The resistance of the sinker 135 becomes lower accordingly.

Illustratively in FIG. 2B, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[m] is farther from thedriver 120. Under such a condition, the resistance contributed by thesource line SL[0] is larger than the resistance contributed by the bitline BL[0] along the current flowing path.

As a result, less of the N-type transistors, including, for example, oneN-type transistors NS1, is controlled to be conducted. The resistance ofthe sinker 135 becomes larger accordingly.

In some approaches, when the row locations of the conducted resistivememory cell are different, the ratios between the wire resistances ofthe source line and the bit line are different. The unbalance betweenthe wire resistances results in different writing voltages applied onthe conducted resistive memory cell. Such approaches potentially causereliability issue.

Compared to the approaches discussed above, the trimmable resistance ofthe sinker 135 varies according to different row locations of theconducted resistive memory cell 115 in the present disclosure. Theunbalance between the wire resistances of the source line and the bitline is compensated. The writing voltages applied on the conductedresistive memory cell 115 corresponding to different row locations arecontrolled to be within an identical range. The reliability issue isthus improved.

Reference is now made to FIG. 3A. FIG. 3A and FIG. 3B. FIG. 3A is asimplified circuit diagram of the driver 125, the conducted resistivememory cell 115 corresponding to the word line WL[0], the sinker 130,the source line SL[0] and bit line BL[0], as illustrated in FIG. 1, inaccordance with various embodiments of the present disclosure. FIG. 3Bis a simplified circuit diagram of the driver 120, the conductedresistive memory cell 115 corresponding to the word line WL[m], thesinker 130, the source line SL[0] and bit line BL[0], as illustrated inFIG. 1, in accordance with various embodiments of the presentdisclosure.

Illustratively, the sinker 130 includes an N-type transistor NSelectrically connected to a ground potential GND. The sinker 130 iscontrolled to be conducted by the signal SLS to sink the write currentIw2.

The driver 125 includes three parallel-connected resistive unitselectrically connected to a voltage source VCH. For illustration, theresistive units are P-type transistors PD1, PD2 and PD3.

According to different row locations of the conducted resistive memorycell 115, different number of the P-type transistors is controlled to beconducted by the signal BLD to provide the write current Iw2. In someembodiments, the signal BLD includes a multiple of bits to control theoperation of the P-type transistors PD1, PD2 and PD3 respectively.

Illustratively in FIG. 3A, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[0] is closer to thedriver 125. Under such a condition, the resistance contributed by thebit line BL[0] is smaller than the resistance contributed by the sourceline SL[0] along the current flowing path.

As a result, less of the number of the P-type transistors, including,for example, only one P-type transistors PD1, is controlled to beconducted. The resistance of the driver 125 becomes larger accordingly.

Illustratively in FIG. 3B, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[m] is farther from thedriver 125. Under such a condition, the resistance contributed by thebit line BL[0] is larger than the resistance contributed by the sourceline SL[0] along the current flowing path.

As a result, more of the number of the P-type transistors, including,for example, all of the three P-type transistors PD1, PD2 and PD3, arecontrolled to be conducted. The resistance of the driver 125 becomeslower accordingly.

As mentioned above, in some approaches, when the row locations of theconducted resistive memory cell are different, the ratios between thewire resistances of the source line and the bit line are different too.The unbalance between the wire resistances results in different writingvoltages applied on the conducted resistive memory cell. Such approachespotentially cause reliability issue.

Compared to the approaches discussed above, the trimmable resistance ofthe driver 125 varies according to different row locations of theconducted resistive memory cell 115. The unbalance between the wireresistances of the source line and the bit line is compensated. Thewriting voltages applied on the conducted resistive memory cell 115corresponding to different row locations are controlled to be within anidentical range. The reliability issue is thus improved.

Reference is now made to FIG. 4A and FIG. 4B. FIG. 4A is a simplifiedcircuit diagram of the driver 120, the conducted resistive memory cell115 corresponding to the word line WL[0], the sinker 135, the sourceline SL[0] and bit line BL[0], as illustrated in FIG. 1, in accordancewith various embodiments of the present disclosure. FIG. 4B is asimplified circuit diagram of the driver 120, the conducted resistivememory cell 115 corresponding to the word line WL[m], the sinker 135,the source line SL[0] and bit line BL[0], as illustrated in FIG. 1, inaccordance with various embodiments of the present disclosure.

In some embodiments, both of the driver 120 and the sinker 135 havetrimmable resistances. Illustratively, the driver 120 includes threeparallel-connected resistive units electrically connected to the voltagesource VCH. For illustration, the resistive units are P-type transistorsPD1, PD2 and PD3. Moreover, the sinker 135 includes threeparallel-connected resistive units electrically connected to the groundpotential GND. For illustration, the resistive units are N-typetransistors NS1, NS2 and NS3.

According to the row location of the conducted resistive memory cell115, different number of the N-type transistors in the sinker 135 iscontrolled to be conducted by the signal BLS to sink the write currentIw1, and different number of the P-type transistors in the driver 120 iscontrolled to be conducted by the signal SLD to sink the write currentIw1.

Illustratively in FIG. 4A, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[0] is closer to thedriver 120. Under such a condition, the resistance contributed by thesource line SL[0] is smaller than the resistance contributed by the bitline BL[0] along the current flowing path.

As a result, more of the number of the N-type transistors, including,for example, all of the three N-type transistors NS1, NS2 and NS3 arecontrolled to be conducted. The resistance of the sinker 135 becomeslower. Moreover, less of the number of the P-type transistors, such asonly one P-type transistor PD1 is controlled to be conducted. Theresistance of the driver 120 becomes larger accordingly.

Illustratively in FIG. 4B, the row location of the conducted resistivememory cell 115 corresponding to the word line WL[m] is farther from thedriver 120. Under such a condition, the resistance contributed by thesource line SL[0] is larger than the resistance contributed by the bitline BL[0] along the current flowing path.

As a result, less of the number of the N-type transistors, including,for example, only one N-type transistors NS1 is controlled to beconducted. The resistance of the sinker 135 becomes larger. Moreover,more of the number of the P-type transistors, such as all of the threeP-type transistors PD1, PD2 and PD3 are controlled to be conducted. Theresistance of the driver 120 becomes smaller accordingly.

As mentioned above, in other approaches, when the row locations of theconducted resistive memory cell 115 are different, the ratios betweenthe wire resistances of the source line and the bit line are differenttoo. The unbalance between the wire resistances results in differentwriting voltages applied on the conducted resistive memory cell 115.Such approaches potentially cause reliability issue.

Compared to the approaches discussed above, the trimmable resistances ofboth of the driver 125 and the sinker 135 vary according to differentrow locations of the conducted resistive memory cell 115. The unbalancebetween the wire resistances of the source line and the bit line iscompensated. The writing voltages applied on the conducted resistivememory cell 115 corresponding to different row locations are controlledto be within an identical range. The reliability issue is thus overcome.

The resistive units implemented by the P-type and N-type transistorsillustrated in FIG. 2A, FIG. 2B, FIG. 3A, FIG. 3B, FIG. 4A and FIG. 4Bare given for illustrative purposes. Various types of resistive units,including, for example, a metal oxide semiconductor (MOS) transistor, ametal resistor, a poly resistors or a combination of the above, arewithin the contemplated scope of the present disclosure. Furthermore,various numbers and configurations of the resistive units are within thecontemplated scope of the present disclosure.

Reference is now made to FIG. 5A to FIG. 5D. FIG. 5A and FIG. 5B areexemplary variations of the configuration of the sinker 135 in FIG. 1,in accordance with various embodiments of the present disclosure. FIG.5C and FIG. 5D are exemplary variations of the configuration of thedriver 125 in FIG. 1, in accordance with various embodiments of thepresent disclosure.

In some embodiments, in FIG. 5A and FIG. 5C, both of the sinker 135 andthe driver 125 include transistors having different dimensions,including, for example, the ratio of the channel width and the channellength (W/L ratio). For illustration, the sinker 135 includes N-typetransistors NS1, NS2 and NS3 having the W/L ratio of W/L_o, W/L_k andW/L_n respectively, in which L_o<L_k<L_n. The driver 125 includes P-typetransistors PD1, PD2 and PD3 having the W/L ratio of W/L_o, W/L_k andW/L_n respectively, in which L_o<L_k<L_n.

With different W/L ratios, the transistors have different resistances.Different combinations of the trimmable resistances of the sinker 135and the driver 125 are accomplished thereby.

For illustration, in FIG. 5B and FIG. 5D, both of the sinker 135 and thedriver 125 include transistors and resistors electrically connectedeither in series or in parallel. In FIG. 5B, the sinker 135 includes theN-type transistor NS1 electrically connected to a resistor R1 andfurther electrically connected to the N-type transistor NS2 in parallel.The combination of the N-type transistors NS1, NS2 and the resistor R1is electrically connected to a resistor R2 in series and furtherelectrically connected to the N-type transistor NS3 in parallel.

In FIG. 5D, the driver 125 includes the P-type transistor PD1electrically connected to a resistor R3 and further electricallyconnected to the P-type transistor PD2 in parallel. The combination ofthe P-type transistors PD1, PD2 and the resistor R3 is electricallyconnected to a resistor R4 in series and further electrically connectedto the P-type transistor PD3 in parallel.

With the connection of the additional resistors, the resistive unitsincluding the transistor and the resistor have different resistances.Different combinations of the trimmable resistances of the sinker 135and the driver 125 are accomplished thereby.

Reference is now made to FIG. 6. FIG. 6 is a flow chart of a method 600illustrating the operation of the memory device 100 in FIG. 1, inaccordance with various embodiments of the present disclosure. Forillustration, the operation of the memory device 100 in FIG. 1 isdescribed by the method 600.

With reference to the method 600 in FIG. 6, in operation 605, one of theresistive memory cells 115 in the selected memory column correspondingto the source line SL[0] and the bit line BL[0], is conducted based onthe address decode information that reflects the row location of theconducted resistive memory cell 115 in the memory column.

In operation 610, the trimmable resistance of at least one of the driver120 and the sinker 135 is trimmed based on the row location.

In operation 615, the driver 120 provides the write current Iw1 flowingthrough the source line SL[0], the conducted resistive memory cell 115and the bit line BL[0] to the sinker 135 to perform write operation.

Reference is now made to FIG. 7. FIG. 7 is a circuit diagram of a memorydevice 700 in accordance with alternative embodiments of the presentdisclosure.

For illustration, the memory device 700 includes the memory array 110arranged in rows and columns as illustrated in FIG. 1. The memory array110 includes the resistive memory cells 115 each disposed at anintersection of one of the memory rows and one of the memory columns.The configuration of the memory array 110 illustrated in FIG. 7 isidentical to the memory array 110 illustrated in FIG. 1. As a result,the detail description of the memory array 110 is not discussed herein.

Compared to the memory device 100 in FIG. 1, in some embodiments, thememory device 700 further includes a reference column 710. The referencecolumn 710 includes a plurality of reference bit cells 715. In someembodiments, each of the reference bit cells 715 includes a transistorRT and does not have interchangeable resistance states as the resistivememory cells 115.

Moreover, in some embodiments, the memory device 700 further includes areference resistor 720 electrically connected to the reference column710. The reference resistor 720 is configured to have a referenceresistance between the high state resistance and the low stateresistance of the resistive memory cells 115. In some embodiments, thereference resistance is a median value of the high state resistance andthe low state resistance of the resistive memory cells 115.

In some embodiments, the reference resistor 720 includes a metal oxidesemiconductor (MOS) resistor 725 conducted in a linear region inresponse to a driving voltage Vr to keep the reference resistance at themedian value of the high state resistance and the low state resistance.

The memory device 700 further includes a sensing unit 730. Forillustration, each of the resistive memory cells 115 in one of thememory columns is electrically connected to the sensing unit 730 througha source line, e.g., one of the source lines SL[0], . . . and SL[n].Furthermore, each of the resistive memory cells 115 in one of the memorycolumns is electrically connected to the sensing unit 730 through a bitline, e.g., one of the bit lines BL[0], . . . and BL[n].

Moreover, each of the reference bit cells 715 is electrically connectedto the sensing unit 730 through a reference source line RESL.Furthermore, each of the reference bit cells 715 is electricallyconnected to the sensing unit 730 through a reference bit line REBL.

In some embodiments, the memory device 700 further includes a pluralitygroups of switches, and each group corresponds to one column ofresistive memory cells 115. For illustration, the group of switches N5,N6, N1 and N2 corresponds to the memory column electrically connected tothe bit line BL[0] and the source line SL[0]. The group of switches N7,N8, N3 and N4 corresponds to the memory column electrically connected tothe bit line BL[n] and the source line SL[n]. Each group of switchesmentioned above is configured for selecting one corresponding column toperform read operation.

For illustration, the switch N5 is electrically connected between thesensing unit 730 and the bit line BL[0]. The switch N5 is under thecontrol of a selection signal RDB[0]. The switch N6 is electricallyconnected between the sensing unit 730 and the source line SL[0]. Theswitch N6 is under the control of the selection signal RDS[0].

The switch N1 is electrically connected between the sinker 135 and thebit line BL[0]. The switch N2 is electrically connected between thesinker 130 and the source line SL[0]. The switch N1 and the switch N2are under the control of the selection signals MUXB[0] and MUXS[0]respectively.

In some embodiments, the switches N1, N2, N5 and N6 are N-typetransistors. In operation, when one of the selection signals RDB[0] andRDS[0] is at a high state and a corresponding one of the selectionsignals MUXB[0] and MUXS[0] is at a high state, one of the switches N1and N2, and one of the switches N5 and N6 are conducted such that thecolumn of the resistive memory cells 115 corresponding to the bit lineBL[0] and the source line SL[0] is selected to perform the readoperation.

For example, when the selection signals RDS[0] and MUXB[0] are at thehigh state and the selection signals RDB[0] and MUXS[0] are at the lowstate, the switches N6 and N1 are conducted while the switches N5 and N2are off such that a read current (not illustrated) flows through theswitch N6, the source line SL[0], the resistive memory cell 115activated by the corresponding word line, the bit line BL[0], the switchN1 and further to the sinker 135 to accomplish the source line readoperation.

On the other hand, when the selection signals RDB[0] and MUXS[0] are atthe high state and the selection signals RDS[0] and MUXB[0] are at thelow state, the switches N5 and N2 are conducted while the switch N6 andN1 are off such that a read current (not illustrated) flows through theswitch N5, the bit line BL[0], the resistive memory cell 115 activatedby the corresponding word line, the source line SL[0], the switch N2 andfurther to the sinker 130 to accomplish the bit line read operation.

For illustration, the switch N7 is electrically connected between thesensing unit 730 and the bit line BL[n]. The switch N7 is under thecontrol of a selection signal RDB[n]. The switch N8 is electricallyconnected between the sensing unit 730 and the source line SL[n]. Theswitch N8 is under the control of the selection signal RDS[n].

The switch N3 is electrically connected between the sinker 135 and thebit line BL[n]. The switch N4 is electrically connected between thesinker 130 and the source line SL[n]. The switch N3 and the switch N4are under the control of the selection signals MUXB[n] and MUXS[n]respectively.

In some embodiments, the switches N3, N4, N7 and N8 are N-typetransistors. In operation, when one of the selection signals RDB[n] andRDS[n] is at a high state and a corresponding one of the selectionsignals MUXB[n] and MUXS[n] is at a high state, one of the switches N3and N4, and one of the switches N7 and N8 are conducted such that thecolumn of the resistive memory cells 115 corresponding to the bit lineBL[n] and the source line SL[n] is selected to perform the readoperation.

For illustration, when the selection signals RDS[n] and MUXB[n] are atthe high state and the selection signals RDB[n] and MUXS[n] are at thelow state, the switches N8 and N3 are conducted while the switches N7and N4 are off such that a read current (not illustrated) flows throughthe switch N8, the source line SL[n], the resistive memory cell 115activated by the corresponding word line, the bit line BL[n], the switchN3 and further to the sinker 135 to accomplish the source line readoperation.

On the other hand, when the selection signals RDB[n] and MUXS[n] are atthe high state and the selection signals RDS[n] and MUXB[n] are at thelow state, the switches N7 and N4 are conducted while the switches N8and N3 are off such that a read current (not illustrated) flows throughthe switch N7, the bit line BL[n], the resistive memory cell 115activated by the corresponding word line, the source line SL[n], theswitch N4 and further to the sinker 130 to accomplish the bit line readoperation.

The detail circuits of the switches N1-N8 illustrated in FIG. 7 aregiven for illustrative purposes. Various circuits for performing columnselection are within the contemplated scope of the present disclosure.

In some embodiments, the memory device 700 further includes a group ofswitches each for selecting the reference column 710 to perform readoperation.

For illustration, the switch N9 is electrically connected between thesensing unit 730 and the reference source line RESL. The switch N9 isunder the control of a selection signal REFSL. The switch N10 iselectrically connected between the sensing unit 730 and the referencebit line REBL. The switch N10 is under the control of a selection signalREFBL.

The switch N11 is electrically connected between the reference resistor720 and the reference source line RESL. The switch N12 is electricallyconnected between the reference resistor 720 and the reference bit lineREBL. The switch N11 and the switch N12 are under the control ofselection signals MUXSR and MUXBR.

In some embodiments, the switches N9, N10, N11 and N12 are N-typetransistors. In operation, when one of the selection signals REFSL andREFBL is at a high state and a corresponding one of the selection signalMUXSR and MUXBR is at a high state, one of the switches N9 and N10 andone of the switches N11 and N12 are conducted such that the referencecolumn 710 is selected to perform the read operation.

For illustration, each of the resistive memory cells 115 in one of thememory rows is electrically connected to a word line, e.g. one of theword lines WL[0], . . . WL[m−1] and WL[m].

In operation, one of the resistive memory cells 115 in a memory columnis controlled to be conducted according to a control signal from thecorresponding word line to perform the read operation. For example, theresistive memory cell 115 in the first memory row in a selected memorycolumns, e.g. the first memory column, is controlled to be conductedaccording to the control signal from the word line WL[0].

Moreover, each of the reference bit cells 715 corresponding to one ofthe memory rows is electrically connected to a word line, e.g., one ofthe word lines WL[0], . . . WL[m−1] and WL[m].

In operation, one of the reference bit cells 715 in the reference column710 is controlled to be conducted according to the control signal fromthe corresponding word line to perform the write operation. For example,the reference bit cells 715 in the first memory row is controlled to beconducted according to the control signal from the word line WL[0].

In some embodiment, the selection signals RDB[0], RDS[0], RDB[n],RDS[n], REFSL, REFBL, MUXB[0] to MUXB[n], MUXS[0] to MUXS[n], MUXSR andMUXBR are generated based on the address decode information.

As a result, based on the selection signals and the control signal, oneof the resistive memory cells 115 is selected to perform read operation.For example, when one of the switches N1, N2 and one of the switches N5and N6 are conducted according to the selection signals RDB[0], RDS[0],MUXB[0] and MUXS[0], and the control signal is transmitted through theword line WL[0], the read operation is performed based on the resistivememory cell 115 disposed in the first memory column and the first memoryrow.

Moreover, based on the selection signals and the control signal, one ofthe reference bit cells 715 is selected to perform read operation. Whenone of the switches N9 and N10 and one of the switches N11 and N12 areconducted according to the selection signal REFSL, REFBL, MUXSR andMUXBR and the control signal is transmitted through the word line WL[0],the read operation is performed based on the reference bit cells 715disposed in the reference column 710.

For illustration, when the selection signals REFSL and MUXBR are at thehigh state and the selection signals REFBL and MUXSL are at the lowstate, the switches N9 and N12 are conducted while the switches N10 andN11 are off. Accordingly, a read current (not labeled) flows through theswitch N9, the reference source line RESL, the reference bit cell 715activated by the corresponding word line, the reference bit line REBL,the switch N12 and further to the reference resistor 720. As a result,the source line read operation is accomplished.

On the other hand, when the selection signals REFBL and MUXSL are at thehigh state and the selection signals REFSL and MUXBR are at the lowstate, the switches N10 and N11 are conducted while the switches N9 andN12 are off. Accordingly, a read current (not labeled) flows through theswitch N10, the reference bit line REBL, the reference bit cell 715activated by the corresponding word line, the reference source lineRESL, the switch N11 and further to the reference resistor 720. As aresult, the bit line read operation is accomplished.

In operation, when one of the resistive memory cells 115 and apositionally corresponding one of the reference bit cells 715 areconducted based on an address decode information, the sensing unit 730is configured to sense a read current Icell drained by the selectedmemory columns, and to sense a reference current Iref drained by thereference column 710 and the reference resistor 720. The sensing unit730 further performs comparison between the read current Icell and thereference current Iref to determine the resistance state of theconducted resistive memory cell 115.

In some embodiments, the conducted resistive memory cell 115 isdetermined to have the low state resistance when the read current Icellis larger than the reference current Iref. The conducted resistivememory cell 115 is determined to have the high state resistance when thecomparator determines that the read current Icell is smaller than thereference current Iref.

Reference is now made to FIG. 8. FIG. 8 is a circuit diagram of thesimplified selected memory column, e.g., the memory column correspondingto the source line SL[0] and the bit line BL[0], the simplifiedreference column 710 and the sensing unit 730, in accordance withvarious embodiments of the present disclosure.

For illustration, the conducted resistive memory cell 115, the switchN1, the source line SL[0] and the bit line BL[0] corresponding to theselected memory column are exemplarily illustrated. The conductedreference bit cells 715, the reference resistor 720, the switch N11, thereference bit line REBL and the reference source line RESL correspondingto the reference column 710 are exemplarily illustrated.

The sensing unit 730 includes a memory driver MPD and a reference driverRPD. In some embodiments, each of the memory driver MPD and thereference driver RPD includes a P-type transistor and the memory driverMPD and the reference driver RPD are electrically connected as a currentmirror. In some embodiments, the memory driver MPD and the referencedriver RPD have identical dimensions to have identical driving ability.

Each of the resistive memory cells 115, e.g., the resistive memory cell115 illustrated in FIG. 8, is electrically connected to the memorydriver MPD to drain the current from the memory driver MPD as the readcurrent Icell. Each of the reference bit cells 715, e.g., the referencebit cell 715 illustrated in FIG. 8, is electrically connected to thereference driver RPD to drain the current from the reference driver RPDas the reference current Iref.

The sensing unit 730 further includes a memory clamping transistors MCTelectrically connected to the bit line BL[0] through a memory read nodeMRE and to the memory driver MPD through a memory sensing node MSE. Inoperation, the memory clamping transistor MCT is configured to clamp thememory read node MRE at a fixed read voltage when the memory driver MPDprovides a first current I1 to the bit line BL[0].

The sensing unit 730 further includes a reference clamping transistorRCT electrically connected to the reference bit line REBL through areference read node RRE and to the reference driver RPD through areference sensing node RSE. In operation, the reference clampingtransistor RCT is configured to clamp the reference read node RRE at thesame fixed read voltage when the reference driver RPD provides a secondcurrent I2 that is identical to the first current I1.

The sensing unit 730 further includes a comparator 800 configured tosense the voltage difference between the memory sensing node MSE and thereference sensing node RSE. The read current Icell and the referencecurrent Iref flow through the memory sensing node MSE and the referencesensing node RSE, respectively.

When the conducted resistive memory cell 115 has the low stateresistance, the resistance of the conducted resistive memory cell 115becomes smaller than the resistance of the reference resistor 720.Accordingly, the voltage at the memory sensing node MSE becomes smallerthan the voltage at the reference sensing node RSE.

On the contrary, when the conducted resistive memory cell 115 has thehigh state resistance, the resistance of the conducted resistive memorycell 115 becomes larger than the resistance of the reference resistor720. Accordingly, the voltage at the memory sensing node MSE becomeslarger than the voltage at the reference sensing node RSE.

Based on the comparison between the voltages at the memory sensing nodeMSE and the reference sensing node RSE, the sensing unit 730 determinesthe resistance state of the conducted resistive memory cell 115.

In some embodiments, the sensing unit 730 generates a readout signal RDhaving a low state when the voltage at the memory sensing node MSE issmaller than the voltage at the reference sensing node RSE. Moreover,the sensing unit 730 generates the readout signal RD having a high statewhen the voltage at the memory sensing node MSE is larger than thevoltage at the reference sensing node RSE.

In some approaches, two reference columns are used, in which each ofthem includes high resistance state reference cells and low resistancestate reference cells. The reference current is generated according tothe two reference columns corresponding to the median value of the highstate resistance and the low state resistance. In such approaches, theread margin is eroded due to the process variation between the tworeference columns.

Compared to the approaches discussed above, the reference resistor 720is used to manipulate the resistance having the median value of the highstate resistance and the low state resistance. With the referenceresistor 720, there is no issue about the process variation betweendifferent reference columns. Not only the components and the area of thereference column are much fewer, but also the read margin improvessince.

Moreover, the resistances contributed by the conducted reference bitcell 715, the reference bit line REBL and the reference source line RESLare identical to the resistances contributed by the conducted resistivememory cell 115, the bit line BL[0] and the source line SL[0]. As aresult, no matter where the location of the conducted resistive memorycell 115 is, the accuracy of the comparison between the read currentIcell and the reference current Iref is maintained.

The reference resistor 720 having one metal oxide semiconductor (MOS)725 illustrated in FIG. 7 and FIG. 8 is given for illustrative purposes.Various numbers and configurations of the metal oxide semiconductor(MOS) resistors are within the contemplated scope of the presentdisclosure. For example, in various embodiments, a multiple ofparallel-connected metal oxide semiconductor (MOS) resistors areincluded in the reference resistor 720. Accordingly, the resistance isfine-tuned according to the number of the metal oxide semiconductor(MOS) resistors controlled to be conducted.

In some embodiments, the operation of the reference resistor 720 iscontrolled by a resistor driving unit (as labeled in FIG. 9). Variousunits or circuits to control the operation of the reference resistor 720are within the contemplated scope of the present disclosure.

Reference is now made to FIG. 9. FIG. 9 is a circuit diagram of theresistor driving unit 900 for driving the reference resistor 720 in FIG.8, in accordance with various embodiments of the present disclosure.

For illustration, the resistor driving unit 900 includes a driving metaloxide semiconductor resistor 910 identical to the metal oxidesemiconductor resistor 725 in the reference resistor 720. Moreover, thedriving metal oxide semiconductor resistor 910 is conducted in thelinear region in response to the driving voltage Vr that conducts themetal oxide semiconductor resistor 725.

The resistor driving unit 900 further includes a current source 920having the same driving ability as the reference driver RPD andconfigured to provide a current I3 to the driving metal oxidesemiconductor resistor 910 through a feedback node FE. In someembodiments, the current source 920 has a non-zero temperaturecoefficient such that the current Id is fine-tuned along differentenvironment conditions.

The resistor driving unit 900 further includes a driving comparator 930to compare a feedback voltage Vd of the feedback node FE and a presetvoltage Vread to generate the driving voltage Vr.

Reference is now made to FIG. 10 with reference to FIG. 9. FIG. 10 is acurrent to voltage (I-V) curve of the operation of the driving metaloxide semiconductor resistor 910 in FIG. 9, in accordance with variousembodiments of the present disclosure.

Illustratively, the driving metal oxide semiconductor resistor 910 isoperated in the linear region, in which the gate to source voltage Vgsof the driving metal oxide semiconductor resistor 910 is the drivingvoltage Vr. As a result, the preset voltage Vread is predetermined suchthat the current Id flowing through the driving metal oxidesemiconductor resistor 910 is fixed at a median value of a value I_RLand a value I_RH.

In some embodiments, the value I_RL is equivalent to the amount of theread current Icell when the conducted resistive memory cell 115 has thelow state resistance. The value I_RH is equivalent to the amount of theread current Icell when the conducted resistive memory cell 115 has thehigh state resistance. As a result, the resistance of the driving metaloxide semiconductor resistor 910 is controlled to be the median value ofthe low state resistance and the high state resistance.

As discussed above, the metal oxide semiconductor resistor 725 isidentical to the driving metal oxide semiconductor resistor 910.Accordingly, the resistance of the metal oxide semiconductor resistor725 is controlled to be the median value of the low state resistance andthe high state resistance as well.

The configuration of the resistor driving unit 900 for driving thereference resistor 720 illustrated in FIG. 9 is given for illustrativepurposes. Various configurations are within the contemplated scope ofthe present disclosure.

The operations of the components in the present disclosure are given forillustrative purposes. Various operations of the components in thepresent disclosure are within the contemplated scope of the presentdisclosure. For example, the components associated with the writeoperation, discussed in the present disclosure, are able to operatecorrespondingly in read operation, and the components associated withthe read operation, discussed in the present disclosure, are able tooperate correspondingly in write operation.

In some embodiments, a device is disclosed that includes a driver, asinker and a memory column. The memory column includes a plurality ofresistive memory cells each being electrically connected between thedriver and the sinker through a first line and a second line. When oneof the resistive memory cells is conducted, the driver, the sinker, or acombination thereof is configured to be controlled to have a resistancedepending on a row location of the conducted resistive memory cell inthe memory column.

Also disclosed is a device that includes a memory column, a referencecolumn and a sensing unit. The memory column includes a plurality ofresistive memory cells. The reference column includes a plurality ofreference bit cells. The sensing unit is configured to compare a readcurrent corresponding to the memory column, with a reference currentcorresponding to a reference column, to determine a resistance state ofa conducted resistive memory cell in the memory column.

Also disclosed is a method that includes operations outlined below. Adriver, a sinker, or a combination thereof is controlled to operate witha resistance depending on a row location of a conducted resistive memorycell electrically connected between the driver and the sinker in amemory column, is controlled to provide a write current from the driverto the sinker.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A device, comprising: a driver; a sinker; and amemory column comprising a plurality of resistive memory cells eachbeing electrically connected between the driver and the sinker through afirst line and a second line; wherein when one of the resistive memorycells is conducted, the driver, the sinker, or a combination thereof isconfigured to be controlled to have a resistance depending on a rowlocation of the conducted resistive memory cell in the memory column. 2.The device of claim 1, wherein one of the first line and the second lineis a bit line, the other one of the first line and the second line is asource line and each of the resistive memory cells is controlled to beconducted according to a control signal from a word line generated basedon the address decode information.
 3. The device of claim 1, wherein thesinker comprises a plurality of parallel-connected resistive units, andwhen the row location of the conducted resistive memory cell in thecolumn is closer to the driver, the more of a number of the resistiveunits is controlled to have a lower resistance.
 4. The device of claim3, wherein the sinker comprises a metal oxide semiconductor (MOS)transistor, a metal resistor, a poly resistor or a combination of theabove.
 5. The device of claim 1, wherein the driver comprises aplurality of parallel-connected resistive units, and when the rowlocation of the conducted resistive memory cell in the column is closerto the driver, the less of a number of the resistive units is controlledto have a higher resistance.
 6. The device of claim 5, wherein thedriver comprises a metal oxide semiconductor transistor, a metalresistor, a poly resistor or a combination of the above.
 7. The deviceof claim 1, wherein each of the resistive memory cells is amagnetoresistive random-access memory (MRAM) or a resistiverandom-access memory (RRAM).
 8. The device of claim 1, wherein thememory column is disposed in a memory array arranged in rows andcolumns, wherein the memory column is one of the columns and the rowlocation of the conducted resistive memory cell in the memory columncorresponds to one of the rows, and each of the first line and thesecond line is electrically connected to the driver and the sinkerthrough a switch such that the memory column is selected based on anaddress decode information.
 9. A device, comprising: a memory columncomprising a plurality of resistive memory cells; a reference columncomprising a plurality of reference bit cells; and a sensing unitconfigured to compare a read current corresponding to the memory column,with a reference current corresponding to a reference column, todetermine a resistance state of a conducted resistive memory cell in thememory column.
 10. The device of claim 9, wherein the sensing unitcomprises: a memory driver and a memory sinker, wherein each of theresistive memory cells is electrically connected between the memorydriver and the memory sinker through a first memory line and a secondmemory line; and a reference driver, wherein each of the reference bitcells is electrically connected between the reference driver and areference resistor through a first reference line and a second referenceline.
 11. The device of claim 10, wherein the sensing unit furthercomprises: a memory clamping transistor electrically connected to thefirst memory line through a memory read node and to the memory driverthrough a memory sensing node, wherein the memory clamping transistor isconfigured to clamp the memory read node at a fixed read voltage; and areference clamping transistor electrically connected to the firstreference line through a reference read node and to the reference driverthrough a reference sensing node, wherein the reference clampingtransistor is configured to clamp the reference read node at the fixedread voltage; and a comparator configured to sense a first voltage and asecond voltage at the memory sensing node and the reference sensing noderespectively.
 12. The device of claim 11, wherein the conductedresistive memory cell is determined to have a low state resistance whenthe comparator determines that the first voltage is smaller than thesecond voltage, and the conducted resistive memory cell is determined tohave a high state resistance when the comparator determines that thefirst voltage is larger than the second voltage.
 13. The device of claim10, wherein the reference resistor comprises a metal oxide semiconductor(MOS) resistor conducted in a linear region in response to a drivingvoltage.
 14. The device of claim 10, further comprising: a driving metaloxide semiconductor resistor that is conducted in a linear region inresponse to a driving voltage; a current source configured to provide acurrent to the driving metal oxide semiconductor resistor through afeedback node; and a driving comparator to compare a feedback voltage ofthe feedback node with a preset voltage to generate the driving voltage.15. The device of claim 10, wherein the reference resistor comprises aplurality of parallel-connected metal oxide semiconductor (MOS)resistors, wherein at least one of the metal oxide semiconductorresistors is conducted in a linear region.
 16. The device of claim 11,wherein the memory column is disposed in a memory array arranged in rowsand columns, wherein the memory column is one of the columns and each ofthe resistive memory cells and one of the corresponding reference bitcells correspond to one of the rows, and the memory column iselectrically connected to the comparator through a switch such that thememory column is selected based on the address decode information.
 17. Amethod, comprising: controlling a driver, a sinker, or a combinationthereof to operate with a resistance depending on a row location of aconducted resistive memory cell electrically connected between thedriver and the sinker in a memory column, to provide a write currentfrom the driver to the sinker.
 18. The method of claim 17, wherein eachof the resistive memory cells is electrically connected between thedriver and the sinker through a first line and a second linerespectively, one of the first line and the second line is a bit line,the other one of the first line and the second line is a source line,and each of the resistive memory cells is conducted according to acontrol signal from a word line generated based on an address decodeinformation.
 19. The method of claim 17, wherein the sinker comprises aplurality of parallel-connected resistive units, the method furthercomprises: controlling more of a number of the resistive units to beconducted to have a lower resistance when the row location of theconducted resistive memory cell in the column is closer to the driver.20. The method of claim 17, wherein the driver comprises a plurality ofparallel-connected resistive units, the method further comprises:controlling less of a number of the resistive units to be conducted tohave a higher resistance when the row location of the conductedresistive memory cell in the column is closer to the driver.